INTEGRATED ENERGY ALBEDO OF SOLID-STATE DETECTORS FOR COMPUTER-AIDED X-RAY TOMOGRAPHY
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
TURYANSKII, AG; FEDOSEEVA, OP; FEDOROVA, TL
1990г. т. 33 номер 1 стр.. 93-96 тип: публикация в журнале

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1990DY33200019

DETERMINATION OF THE DYNAMIC NONLINEARITY OF SEMICONDUCTOR AND COMBINED DETECTORS FOR COMPUTER-ASSISTED TOMOGRAPHY
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
TURYANSKII, AG; KONKOV, VV; FEDOSEEVA, OP
1987г. т. 30 номер 3 стр.. 712-714 тип: публикация в журнале

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1987L715000026

MINIMIZING PHOTOMEMORY EFFECTS IN X-RAY FLUX MEASUREMENT IN COMPUTERIZED-TOMOGRAPHY
MEASUREMENT TECHNIQUES USSR
TURYANSKII, AG; FEDOSEEVA, OP
1986г. т. 29 номер 3 стр.. 226-228 тип: публикация в журнале

DOI - 10.1007/BF00863858
WoS id - WOS:A1986E971100018

DETERMINATION OF CONVERSION NONLINEARITY FOR X-RAY-DETECTORS
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
TURYANSKII, AG; FEDOSEEVA, OP
1985г. т. 28 номер 3 стр.. 567-569 тип: публикация в журнале

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1985AWZ7100017

IMITATION MODEL OF PERIODIC CHEMICOPHARMACEUTICAL TECHNOLOGICAL PROCESS AND ITS APPLICATION FOR THE DESIGN OF COMPUTERIZED CONTROL-SYSTEM
KHIMIKO-FARMATSEVTICHESKII ZHURNAL
EROKHINA, TM; KUSKOV, EK; LIBERMAN, MD; TURYANSKY, AG
1984г. т. 18 номер 2 стр.. 222-226 тип: публикация в журнале

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1984SG14200023

CARBON CONCENTRATION-DEPENDENCE, ON THE SURFACE OF GAAS EPITAXIAL-FILMS, ON THE SUBSTRATE DISORIENTATION DEGREE IN RELATION TO A CRYSTALLOGRAPHIC PLANE
FIZIKA TVERDOGO TELA
LOIKO, NN; MAKSIMOVSKII, SN; NOLLE, EL; PENIN, NA; PETROV, AE; TURYANSKII, AG
1982г. т. 24 номер 9 стр.. 2595-2598 тип: публикация в журнале

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1982PH54100010

STRUCTURE AND OPTICAL-PROPERTIES OF SILICON IMPLANTED BY HIGH-DOSES OF 70 AND 310 KEV CARBON-IONS
RADIATION EFFECTS AND DEFECTS IN SOLIDS
AKIMCHENKO, IP; KISSELEVA, KV; KRASNOPEVTSEV, VV; TOURYANSKI, AG; VAVILOV, VS
1980г. т. 48 номер 1-4 стр.. 7-12 (цит. wos) 22 тип: публикация в журнале

DOI - 10.1080/00337578008209220
WoS id - WOS:A1980JZ20700002

X-RAY-DIFFRACTOMETRIC PROCEDURE FOR INVESTIGATING THIN JUNCTION STRUCTURES
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
TURYANSKII, AG
1976г. т. 19 номер 1 стр.. 239-241 тип: публикация в журнале

Scopus id - 2-s2.0-84954041360
WoS id - WOS:A1976CK79300033